Directorio
VALENTÍN GUTIÉRREZ GIL
Categoría
CONTRATO PREDOCTORAL VI PLAN PROPIO
Departamento
Área
Electrónica
Docencia
Investigación
Grupo de investigación
DISEÑO Y TEST DE CIRCUITOS INTEGRADOS DE SEÑAL MIXTA (DISEÑO Y TEST DE CIRCUITOS INT)
Asistencia a congresos
Gutierrez, Valentin;Leger-, Gildas:
On the importance of bias-dependent charge injection for SET evaluation in AMS Circuits. Comunicación en congreso. 2020 18th IEEE International New Circuits and Systems Conference (NEWCAS). Montreal, Canada. 2020
On the importance of bias-dependent charge injection for SET evaluation in AMS Circuits. Comunicación en congreso. 2020 18th IEEE International New Circuits and Systems Conference (NEWCAS). Montreal, Canada. 2020
Gutierrez, Valentin;Leger, Gildas:
SET sensitivity evaluation, a comparison before and after layout. Comunicación en congreso. 2019 XXXIV Conference on Design of Circuits and Integrated Systems (DCIS). BILBAO (ESPAÑA). 2019
SET sensitivity evaluation, a comparison before and after layout. Comunicación en congreso. 2019 XXXIV Conference on Design of Circuits and Integrated Systems (DCIS). BILBAO (ESPAÑA). 2019
Gutierrez, Valentin;Leger-, Gildas:
Adaptive defect simulation flow for Defect-oriented Test evaluation. Sesión no plenaria en Congreso. 2019 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD). Lausanne, ALPINE CENTER PIORA, SWITZERLAND. 2019
Adaptive defect simulation flow for Defect-oriented Test evaluation. Sesión no plenaria en Congreso. 2019 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD). Lausanne, ALPINE CENTER PIORA, SWITZERLAND. 2019
Gutierrez, Valentin;Leger-, Gildas:
Single Event Transient injection in large mixed-signal circuits. Sesión no plenaria en Congreso. 2018 Conference on Design of Circuits and Integrated Systems (DCIS). Lyon, France. 2018
Single Event Transient injection in large mixed-signal circuits. Sesión no plenaria en Congreso. 2018 Conference on Design of Circuits and Integrated Systems (DCIS). Lyon, France. 2018
Gutierrez, Valentin;Gines-Arteaga, Antonio Jose;Leger-, Gildas:
AMS-RF test quality: Assessing defect severity.. Comunicación en congreso. IEEE International Symposium on On-Line Testing And Robust System Design. Platja d'Aro, Spain. 2018
AMS-RF test quality: Assessing defect severity.. Comunicación en congreso. IEEE International Symposium on On-Line Testing And Robust System Design. Platja d'Aro, Spain. 2018
Artículos publicados
Gutierrez, Valentin;Leger-, Gildas:
An adaptive simulation framework for AMS-RF test quality. Integration. 2020. Vol: 73. Pág. 10-17. 10.1016/j.vlsi.2020.03.003.
An adaptive simulation framework for AMS-RF test quality. Integration. 2020. Vol: 73. Pág. 10-17. 10.1016/j.vlsi.2020.03.003.
Gutierrez, Valentin;Gines-Arteaga, Antonio Jose;Leger-, Gildas:
Assessing AMS-RF Test Quality by Defect Simulation. IEEE Transactions on Device and Materials Reliability. 2019. Vol: 19. Núm: 1. Pág. 55-63.
Assessing AMS-RF Test Quality by Defect Simulation. IEEE Transactions on Device and Materials Reliability. 2019. Vol: 19. Núm: 1. Pág. 55-63.
