Gutierrez, Valentin;Leger-, Gildas:
On the importance of bias-dependent charge injection for SET evaluation in AMS Circuits. Comunicación en congreso. 2020 18th IEEE International New Circuits and Systems Conference (NEWCAS). Montreal, Canada. 2020
Gutierrez, Valentin;Leger, Gildas:
SET sensitivity evaluation, a comparison before and after layout. Comunicación en congreso. 2019 XXXIV Conference on Design of Circuits and Integrated Systems (DCIS). BILBAO (ESPAÑA). 2019
Gutierrez, Valentin;Leger-, Gildas:
Adaptive defect simulation flow for Defect-oriented Test evaluation. Sesión no plenaria en Congreso. 2019 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD). Lausanne, ALPINE CENTER PIORA, SWITZERLAND. 2019
Gutierrez, Valentin;Leger-, Gildas:
Single Event Transient injection in large mixed-signal circuits. Sesión no plenaria en Congreso. 2018 Conference on Design of Circuits and Integrated Systems (DCIS). Lyon, France. 2018
Gutierrez, Valentin;Gines-Arteaga, Antonio Jose;Leger-, Gildas:
AMS-RF test quality: Assessing defect severity.. Comunicación en congreso. IEEE International Symposium on On-Line Testing And Robust System Design. Platja d'Aro, Spain. 2018
